Product category
SEMILAB發(fā)射極薄層電阻測量裝置SHR-1000 壽命測定裝置PV-2000A,壽命測量儀WT-1200,WT-1200B,WT-1200A,4探針薄層電阻測量儀FPP-1000,發(fā)射極薄層電阻測量裝置SHR-1000,激光橢圓儀LE-103PV
SEMILAB薄膜厚度和電阻率測量裝置WMT 光致發(fā)光PLl-101/A, PLI-103/A,壽命測量裝置WML,WLL,薄膜厚度和電阻率測量裝置WMT,WLT,晶體形狀測量裝置TTR-300,發(fā)射極片電阻測量裝置CMS,CLS,激光橢圓儀SE-100IL,LE-100IL
電阻率計(jì)SEMILAB鋼錠缺陷檢測裝置PLB-55 鋼錠缺陷檢測裝置PLB-55,PLB-55i,電阻率計(jì)RT-1000,體積電阻率測量裝置RT-110,載流子壽命測定裝置WT-2000P,WT-2010D,μPCD載流子壽命測量裝置WT-2000PVN
分光橢偏儀SEMILAB在線光譜橢偏儀SE-3000 在線光譜橢偏儀SE-3000,在線光譜橢偏儀μSE-2500,分光橢偏儀SE-2100 (旋轉(zhuǎn)補(bǔ)償器型),分光橢偏儀SE-2000 (旋轉(zhuǎn)補(bǔ)償器型),分光橢偏儀SE-2000 (旋轉(zhuǎn)補(bǔ)償器型),激光橢圓儀LE-5100
錯位缺陷可視化裝置EnVision SEMILAB 光致發(fā)光WT-2000PL,錯位缺陷可視化裝置EnVision,非接觸式遷移率測量LEI-1610系列,FAa lei-1610E100AM,LEI-1610E100R,LEI-1616AM,LEI-1618AM,LEI-1616RP,LEI-1618RP